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Korn, Uri. 2017. “Strategies for Modeling Loss Development: Curve Fitting, Credibility, and Layer Adjustments.” Variance 11 (1–2): 95–117.
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  • Figure 1. Average LDFs
  • Figure 2. IPOC fit to example data
  • Figure 3. Box-Cox tests on LDFs
  • Figure 4. DIPOC fit on example data
  • Figure 5. Splines illustration
  • Figure 6. Spline variables
  • Figure 7. SMIPOC fit on example data
  • Figure 8. RIPOD fit on example data
  • Figure 9. SMIPOD fit on example data
  • Figure 10. Average LDFs for credibility examples
  • Figure 11. SMIPOC credibility weighting—Naive method
  • Figure 12. DIPOC credibility weighting—Naive method
  • Figure 13. SMIPOC credibility weighting—inversion method
  • Figure 14. DIPOC credibility weighting—inversion method
  • Figure 15. LDFs for credibility weighting with the RIPOD on the original parameters
  • Figure 16. CDF for credibility weighting with the RIPOD on the original parameters
  • Figure 17. LDFs for credibility weighting with the RIPOD on the inverted parameters
  • Figure 18. CDF for credibility weighting with the RIPOD on the inverted parameters
  • Figure 19. LDFs for credibility weighting with the SMIPOD on the original parameters
  • Figure 20. CDF for credibility weighting with the SMIPOD on the original parameters
  • Figure 21. LDFs for credibility weighting the SMIPOD on the inverted parameters
  • Figure 22. CDF for credibility weighting the SMIPOD on the inverted parameters

Abstract

This paper discusses some strategies to better handle the modeling of loss development patterns. Some improvements to current curve- and distribution-fitting strategies are shown, including the use of smoothing splines to help the modeled patterns better fit the data. A strategy is shown for applying credibility to these curves that produces results that are well-behaved and that can be implemented without the use of Bayesian software. Next, it is shown how the fitted models can be leveraged to help determine the optimal look-back period to use for selecting LDFs as well as to calculate the parameter and process error distributions. Lastly, a technique is demonstrated for making adjustments to LDFs for different limits, loss caps, and attachment points.